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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
DC Porosity (Holiday) detector. Detects pinholes in coatings above 150um on metal substrates such as pipes and tanks. 0-30kV, 3.5 digit L..
Measures the force required to pull a specified test diameter of coating away from its substrate using hydraulic pressure. Pressure is di..
The Olympus 38DL Plus Ultrasonic Thickness Gauge performs non-destructive measurements. This unit is supplied with transducers that can meas..
Pulse porosity (Holiday) detector. Detects pinholes in coatings and wrapping above 150µm on metal substrates such as pipes and tanks. Can..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis